Defect recognition and image processing in semiconductors 1997 - proceedings of the seventh International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997

Författare
Ingrid Rechenberg Joerg Donecker International Conference on Defect Recognition and Image Processing in Semiconductors 1997) Templin :
(Edited by J. Donecker and I. Rechenberg.)
Genre
Konferenser, Ej skönlitteratur, Konferenspublikation
Språk
Engelska
Förlag År Ort Om boken ISBN
Institute of Physics Publishing cop. 1998 Storbritannien, Bristol xx, 524 sidor. ill., diagr., tab.